Good and adhesive semiconducting films of ZnO (approximate to 100-1100 nm) were deposited over planar borosilicate glass by spray pyrolysis and dip & dry method. The films were characterized by Xray diffraction and optical absorption measurements. The band gap of these films were found to be 3.21 eV and the films were randomly oriented having average crystallite sizes of 20 to 25 nm.
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