Abstract:
X-ray emission spectra in compound thin films are scarce, although such studies in metals, alloys and other inorganic compounds are available. In this study, compound thin films of V2O5-MoO3 and powders of same compositions were investigated to see the effect of V2O5 incorporation in an MoO3 matrix. For this purpose, K beta, L alpha and L beta emissions from Mo present in these matrices were measured. The full width at half-maximum (FWHM) of L alpha(2) and L beta(1) in thin films were found to be different from that of powders. Most of these emission bands show a low asymmetry index before these are split into separate hands. All these findings have been explained on the basis of vacancy production, core hole lifetime, crystal structure and stoichiometric variation of MoO3 in the V2O5 matrix. Copyright (C) 2000 John Wiley & Sons, Ltd.