Som, T.; Sinha, O.P.; Ghatak, J.; Satpati, B.; Kanjilal, D.
(Defence Science Journal, 59(4), 2009: 351-355)
Studies on MeV heavy ion beam-induced epitaxial crystallisation of a buried silicon nitride layer are reported. Transmission electron micrographs and selected area diffraction patterns have been used to study the ...