Chattopadhyay, S.; Dutta, S.; Jana, D.; Chattopadhyay, S.; Sarkar, A.; Kumar, P.; Kanjilal, D.; Mishra, D.K.; Ray, S.K.
(Journal Of Applied Physics, 107(11), 2010)
Defect characterization in 1.2 MeV Ar8+ irradiated polycrystalline ZnO has been carried out by x-ray diffraction (XRD), scanning electron microscopy (SEM) along with electrical resistivity, and photoluminescence (PL) ...