| dc.contributor.author |
Parhi, N. |
|
| dc.contributor.author |
Nayak, B.B. |
|
| dc.contributor.author |
Acharya, B.S. |
|
| dc.date.accessioned |
2018-10-01T12:19:49Z |
|
| dc.date.available |
2018-10-01T12:19:49Z |
|
| dc.date.issued |
1995 |
|
| dc.identifier.citation |
Thin Solid Films, 254(1-2), 1995: 47-53 |
|
| dc.identifier.issn |
0040-6090 |
|
| dc.identifier.uri |
http://ore.immt.res.in/handle/2018/490 |
|
| dc.description.abstract |
The homogeneous coprecipitation (electroless method) technique has been utilized successfully to deposit Bi2S3-PbS alloy thin films on glass substrates. Characterization of such films have been carried out using X-ray diffraction, scanning electron microscopy (SEM) and resistivity studies. It has been observed that powders and thin films deposited by this method behave differently. The crystal structure remains distorted orthorhombic although the lattice constants change upon alloying. Both substitutional and interstitial replacement of cations and anions take place in this system in the case of powders as well as thin films. SEM and resistivity studies corroborate these above observations. |
|
| dc.language |
en |
|
| dc.publisher |
Elsevier |
|
| dc.relation.isreferencedby |
SCI |
|
| dc.rights |
Copyright [1995]. All efforts have been made to respect the copyright to the best of our knowledge. Inadvertent omissions, if brought to our notice, stand for correction and withdrawal of document from this repository. |
|
| dc.subject |
Materials Sciences |
|
| dc.subject |
Materials Sciences |
|
| dc.subject |
Physical Sciences |
|
| dc.subject |
Physical Sciences |
|
| dc.title |
PREPARATION AND CHARACTERIZATION OF BI2S3-PBS THIN-FILMS BY X-RAY-DIFFRACTION, SCANNING ELECTRON-MICROSCOPY AND RESISTIVITY STUDIES |
|
| dc.type |
Journal Article |
|
| dc.affiliation.author |
CSIR-IMMT, Bhubaneswar 751013, Odisha, India |
|