| dc.contributor.author |
Nayak, B.B. |
|
| dc.contributor.author |
Acharya, B.S. |
|
| dc.contributor.author |
Singh, S.K. |
|
| dc.date.accessioned |
2018-10-01T12:19:11Z |
|
| dc.date.available |
2018-10-01T12:19:11Z |
|
| dc.date.issued |
1988 |
|
| dc.identifier.citation |
Thin Solid Films, 164, 1988: 75-80 |
|
| dc.identifier.issn |
0040-6090 |
|
| dc.identifier.uri |
http://ore.immt.res.in/handle/2018/243 |
|
| dc.language |
en |
|
| dc.publisher |
Elsevier |
|
| dc.relation.isreferencedby |
SCI |
|
| dc.rights |
Copyright [1988]. All efforts have been made to respect the copyright to the best of our knowledge. Inadvertent omissions, if brought to our notice, stand for correction and withdrawal of document from this repository. |
|
| dc.subject |
Materials Sciences |
|
| dc.subject |
Materials Sciences |
|
| dc.subject |
Physical Sciences |
|
| dc.subject |
Physical Sciences |
|
| dc.title |
X-RAY-EMISSION SPECTROSCOPY STUDY OF SUBSTOICHIOMETRIC BI2-XSBXS3 SYSTEM |
|
| dc.type |
Journal Article |
|
| dc.affiliation.author |
CSIR-IMMT, Bhubaneswar 751013, Odisha, India |
|