| dc.contributor.author |
Nayak, B.B. |
|
| dc.contributor.author |
Singh, S.K. |
|
| dc.contributor.author |
Acharya, B.S. |
|
| dc.date.accessioned |
2018-10-01T12:19:10Z |
|
| dc.date.available |
2018-10-01T12:19:10Z |
|
| dc.date.issued |
1988 |
|
| dc.identifier.citation |
Physica Status Solidi A-Applied Research, 105(2), 1988: 455-459 |
|
| dc.identifier.issn |
0031-8965 |
|
| dc.identifier.uri |
http://ore.immt.res.in/handle/2018/233 |
|
| dc.language |
en |
|
| dc.publisher |
Akademie Verlag Gmbh |
|
| dc.relation.isreferencedby |
SCI |
|
| dc.rights |
Copyright [1988]. All efforts have been made to respect the copyright to the best of our knowledge. Inadvertent omissions, if brought to our notice, stand for correction and withdrawal of document from this repository. |
|
| dc.subject |
Materials Sciences |
|
| dc.subject |
Physical Sciences |
|
| dc.subject |
Physical Sciences |
|
| dc.title |
CHARACTERIZATION OF AS-GROWN AND IODINATED BI2S3 THIN-FILMS ON SILICON AND QUARTZ SUBSTRATES BY XRD |
|
| dc.type |
Journal Article |
|
| dc.affiliation.author |
CSIR-IMMT, Bhubaneswar 751013, Odisha, India |
|