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Structural Evidence of Nanocrystalline beta-SiC from Fourier Transform Infrared Spectroscopy and Micro-Raman Studies

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dc.contributor.author Mohapatra, S.
dc.date.accessioned 2018-10-01T12:25:04Z
dc.date.available 2018-10-01T12:25:04Z
dc.date.issued 2013
dc.identifier.citation Nanoscience And Nanotechnology Letters, 5(5), 2013: 587-592
dc.identifier.issn 1941-4900
dc.identifier.uri http://ore.immt.res.in/handle/2018/1805
dc.description.abstract Nanocrystalline beta-SiC powder was synthesized by thermal plasma in-flight technique. From the transmission electron microscopy, the nanocrystalline product was found to be consisting of nano particles, and nano rods of average diameter 20 nm and length 500 nm. The structural evidence of formation of nanocrystalline beta-SiC is observed from the X-ray diffraction studies. The beta-phase of the SiC product was also detected through micro-Raman spectrum from two distinct phonon vibration modes at 783 and 982 cm(-1). The transmittance peak observed at 817 cm(-1) in Fourier transform infrared spectroscopy confirms the product as beta-SiC.
dc.language en
dc.publisher American Scientific Publishers
dc.relation.isreferencedby SCI
dc.rights Copyright [2013]. All efforts have been made to respect the copyright to the best of our knowledge. Inadvertent omissions, if brought to our notice, stand for correction and withdrawal of document from this repository.
dc.subject Engineering
dc.subject Materials Sciences
dc.subject Physical Sciences
dc.title Structural Evidence of Nanocrystalline beta-SiC from Fourier Transform Infrared Spectroscopy and Micro-Raman Studies
dc.type Journal Article
dc.affiliation.author Paradeep Coll, Paradeep 754142, Odisha, India


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