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CHARACTERIZATION OF CHEMICALLY DEPOSITED PB1-XCDXS FILMS BY SCANNING ELECTRON-MICROSCOPY

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dc.contributor.author Nayak, B.B.
dc.contributor.author Acharya, H.N.
dc.date.accessioned 2018-10-01T12:19:04Z
dc.date.available 2018-10-01T12:19:04Z
dc.date.issued 1985
dc.identifier.citation Journal Of Materials Science Letters, 4(5), 1985: 651-652
dc.identifier.issn 0261-8028
dc.identifier.uri http://ore.immt.res.in/handle/2018/172
dc.language en
dc.publisher Chapman Hall
dc.relation.isreferencedby SCI
dc.rights Copyright [1985]. All efforts have been made to respect the copyright to the best of our knowledge. Inadvertent omissions, if brought to our notice, stand for correction and withdrawal of document from this repository.
dc.subject Materials Sciences
dc.title CHARACTERIZATION OF CHEMICALLY DEPOSITED PB1-XCDXS FILMS BY SCANNING ELECTRON-MICROSCOPY
dc.type Journal Article
dc.affiliation.author CSIR-IMMT, Bhubaneswar 751013, Odisha, India


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