Browsing by Author "Nair, C.G.K."

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A journey towards characterization of processed Indian minerals - XRD & XRF approach

Acharya, B.S.; Rajeev (Trends In NDE Science And Technology - Proceedings Of The 14th World Conference On NDT (14th WCNDT), Vols 1-5, 1996: 811-814)

XRD and XRF methods have been used in combination as well as separately to characterize chromite over burden, fly ash, steel mill slag etc. and it has been found that these methods are very much useful for comprehensive ...
Identification of 21-R polytype in plasma synthesized SiC by XRD

Nayak, B.B.; Acharya, B.S. (Trends In NDE Science And Technology - Proceedings Of The 14th World Conference On NDT (14th WCNDT), Vols 1-5, 1996: 1389-1392)

Silicon carbide was prepared from rice husk by thermal plasma synthesis. XRD was employed to identify the phase of the polycrystalline powder product. By using a special computer program the polytype of the samples was ...
X-ray diffraction as a nondestructive tool for characterization of thin films, nanocrystalline and refractory materials

Acharya, B.S.; Nayak, B.B. (Trends In NDE Science And Technology - Proceedings Of The 14th World Conference On NDT (14th WCNDT), Vols 1-5, 1996: 893-896)

X-Ray diffraction has been used as a tool to characterize Bi2S3, PbS, CdS and their alloy films. Nickel silicide films grown on silicon substrate have also been characterized for thier phase identification. It has been ...

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